© 2017 Staats- und Universitätsbibliothek
Hamburg, Carl von Ossietzky

Öffnungszeiten heute09.00 bis 24.00 Uhr alle Öffnungszeiten

Eingang zum Volltext in OPUS

Hinweis zum Urheberrecht

Dissertation zugänglich unter
URN: urn:nbn:de:gbv:18-79581
URL: http://ediss.sub.uni-hamburg.de/volltexte/2016/7958/

Processing and imaging of seismic diffraction using multiparameter stacking attributes

Prozessierung und Abbildung von seismischen Diffrakionen mittels Multiparameter Stapelungsattributen

Bakhtiari Rad, Parsa

 Dokument 1.pdf (20.268 KB) 

Freie Schlagwörter (Deutsch): Diffraktionsseparation , seismisches Abbilden , Stapelung , CRS
Freie Schlagwörter (Englisch): Seimic imaging , Diffraction separation , Diffraction imaging , Stacking , CRS
Basisklassifikation: 38.72
Institut: Geowissenschaften
DDC-Sachgruppe: Geowissenschaften
Dokumentart: Dissertation
Hauptberichter: Gajewski, Dirk (Prof. Dr.)
Sprache: Englisch
Tag der mündlichen Prüfung: 21.06.2016
Erstellungsjahr: 2016
Publikationsdatum: 12.07.2016
Kurzfassung auf Englisch: Conventional seismic processing and imaging techniques are tuned to enhance reflections while diffractions are considered as noise. However, diffraction imaging plays a key role in high-resolution characterization of small-scale subsurface structures. A key step of diffraction imaging and tomography is diffraction separation and enhancement especially in the full pre-stack data volume. In this work, we consider point diffractors and present a fast and robust workflow for pre-stack diffraction separation based on
wavefront attributes which are determined using the common-reflection-surface (CRS) method. In the first stage, we use a zero-offset based extrapolation operator for pre-stack diffraction separation, which combines the robustness and stability of the zero-offset CRS processing with enhanced resolution and improved illumination of the finite-offset CRS processing. When finite-offset diffracted events are separated, in the second stage, we suggest a diffraction-based time migration velocity model building which provides high-quality diffraction velocity spectra. Applications of the new workflow to 2D~/~3D complex synthetic data reveal the high potential of diffractions for improved time imaging.


keine Statistikdaten vorhanden